Cork, Christopher: search on Z-Library

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1

Double-patterning interactions with wafer processing, optical proximity correction, and physical design flows

Cork, Christopher

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2009

Language:

english

File:

PDF, 2.09 MB

english, 2009

2

Leading-Edge Separation Control Using Alternating-Current and Nanosecond-Pulse Plasma Actuators

Kelley, Christopher L., Bowles, Patrick O., Cooney, John, He, Chuan, Corke, Thomas C., Osborne, Bradley A., Silkey, Joseph S., Zehnle, Joseph

Journal:

Year:

2014

Language:

english

File:

PDF, 803 KB

english, 2014

3

SPIE Proceedings [SPIE Photomask and Next Generation Lithography Mask Technology XI - Yokohama, Japan (Wednesday 14 April 2004)] Photomask and Next-Generation Lithography Mask Technology XI - Model-based interpretation filtering for complex two-dimensional layout features

Melvin III, Lawrence S., Tanabe, Hiroyoshi, Shiely, James P., Cork, Christopher M., Rieger, Michael L.

Year:

2004

Language:

english

File:

PDF, 99 KB

english, 2004

4

In vitro RNA-seq-based toxicogenomics assessment shows reduced biological effect of tobacco heating products when compared to cigarette smoke

Haswell, Linsey E., Corke, Sarah, Verrastro, Ivan, Baxter, Andrew, Banerjee, Anisha, Adamson, Jason, Jaunky, Tomasz, Proctor, Christopher, Gaça, Marianna, Minet, Emmanuel

Journal:

Scientific Reports

Year:

2018

Language:

english

File:

PDF, 3.42 MB

english, 2018

5

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Design for Manufacturability through Design-Process Integration - Ensuring production-worthy OPC recipes using large test structure arrays

Cork, Christopher, Wong, Alfred K. K., Singh, Vivek K., Zimmermann, Rainer, Mei, Xin, Shahin, Alexander

Year:

2007

Language:

english

File:

PDF, 426 KB

english, 2007

6

Design and Scaling of Plasma Streamwise Vortex Generators for Flow Separation Control

Kelley, Christopher L., Corke, Thomas C., Thomas, Flint O., Patel, Mehul, Cain, Alan B.

Journal:

Year:

2016

Language:

english

File:

PDF, 2.02 MB

english, 2016

7

Book Reviews

Druxes, Helga, Goodwin, Christopher Thomas, Corke, Catriona, Hager, Carol, von Mering, Sabine, Newnham, Randall, Luppes, Jeff

Journal:

German Politics & Society

Year:

2018

Language:

english

File:

PDF, 113 KB

english, 2018

8

[American Institute of Aeronautics and Astronautics 50th AIAA Aerospace Sciences Meeting including the New Horizons Forum and Aerospace Exposition - Nashville, Tennessee ()] 50th AIAA Aerospace Sciences Meeting including the New Horizons Forum and Aerospace Exposition - High Mach Number Leading-Edge Flow Separation Control Using AC DBD Plasma Actuators

Kelley, Christopher, Bowles, Patrick, Cooney, John, He, Chuan, Corke, Thomas, Osborne, Brad, Silkey, Joseph, Zehnle, Joseph

Year:

2012

Language:

english

File:

PDF, 15.36 MB

english, 2012

9

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Design and Process Integration for Microelectronic Manufacturing II - Mathematically describing the target contour in silicon such that model-based OPC can best realize design intent

Cork, Christopher M., Liebmann, Lars W., Balasingam, Pratheep, Sandvik, Sonya, Kielhorn, Bill, Rieger, Michael L.

Year:

2004

Language:

english

File:

PDF, 427 KB

english, 2004

10

Mechanism for Increased Viscous Drag over Porous Sheet Acoustic Liners

Jasinski, Christopher, Corke, Thomas

Journal:

Year:

2020

File:

PDF, 3.62 MB

2020

11

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 6 October 2008)] Photomask Technology 2008 - Assist feature aware double patterning decomposition

Cork, Christopher, Kawahira, Hiroichi, Zurbrick, Larry S., Barnes, Levi, Luk-Pat, Gerard

Year:

2008

Language:

english

File:

PDF, 8.29 MB

english, 2008

12

Biochemical changes during storage of sweet potato roots differing in dry matter content

Zhitian Zhang, Christopher C. Wheatley, Harold Corke

Journal:

Postharvest Biology and Technology

Year:

2002

Language:

english

File:

PDF, 177 KB

english, 2002

13

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 13 September 2004)] 24th Annual BACUS Symposium on Photomask Technology - Maintaining lithographic quality during OPC for low-k1 and MEEF processes constrained by mask dimensional rules

Cork, Christopher M., Staud, Wolfgang, Weed, J. Tracy, Melvin III, Lawrence S., Miller, Michael, Lugg, Robert M., Rieger, Michael L.

Year:

2004

Language:

english

File:

PDF, 187 KB

english, 2004

14

SPIE Proceedings [SPIE Photomask and NGL Mask Technology XVI - Yokohama, Japan (Wednesday 8 April 2009)] Photomask and Next-Generation Lithography Mask Technology XVI - Double patterning addressing imaging challenges for near- and sub-k 1 =0.25 node layouts

Seo, Beom-Seok, Hosono, Kunihiro, Kang, Dae-Kwon, Noh, Myung-Soo, Lee, Sung-Ho, Cork, Christopher, LukPat, Gerald, Miloslavsky, Alexander, Li, Xiaohai, Lucas, Kevin, Lee, Sooryong

Year:

2009

Language:

english

File:

PDF, 2.65 MB

english, 2009

15

Monitoring Animal Behaviour and Environmental Interactions Using Wireless Sensor Networks, GPS Collars and Satellite Remote Sensing

Handcock, Rebecca N., Swain, Dave L., Bishop-Hurley, Greg J., Patison, Kym P., Wark, Tim, Valencia, Philip, Corke, Peter, O’Neill, Christopher J.

Journal:

Year:

2009

Language:

english

File:

PDF, 1.22 MB

english, 2009

16

[IEEE 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Stresa, Italy (2007.06.11-2007.06.12)] 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Proximity correction of IC layouts using scanner fingerprints

Cork, Christopher, Depre, Laurent, Tyminski, Jacek

Year:

2007

Language:

english

File:

PDF, 266 KB

english, 2007

17

[American Institute of Aeronautics and Astronautics 25th AIAA Applied Aerodynamics Conference - Miami, Florida ()] 25th AIAA Applied Aerodynamics Conference - A Simplified Strategy for Optimizing Flow-Control-Configured Airfoils

Nelson, Christopher, Cain, Alan, Patel, Mehul, Corke, Thomas

Year:

2007

Language:

english

File:

PDF, 5.52 MB

english, 2007

18

[IEEE 2016 IEEE Winter Conference on Applications of Computer Vision (WACV) - Lake Placid, NY, USA (2016.3.7-2016.3.10)] 2016 IEEE Winter Conference on Applications of Computer Vision (WACV) - Fine-grained classification via mixture of deep convolutional neural networks

Ge, ZongYuan, Bewley, Alex, McCool, Christopher, Corke, Peter, Upcroft, Ben, Sanderson, Conrad

Year:

2016

Language:

english

File:

PDF, 1.71 MB

english, 2016

19

SPIE Proceedings [SPIE SPIE's 1995 Symposium on Microlithography - Santa Clara, CA (Sunday 19 February 1995)] Integrated Circuit Metrology, Inspection, and Process Control IX - Near and sub-half-micrometer geometry SEM metrology requirements for good process control

Cork, Christopher M., Canestrari, Paolo, De Natale, Paolo, Vasconi, Mauro, Bennett, Marylyn H.

Year:

1995

Language:

english

File:

PDF, 928 KB

english, 1995

20

[American Institute of Aeronautics and Astronautics 54th AIAA Aerospace Sciences Meeting - San Diego, California, USA ()] 54th AIAA Aerospace Sciences Meeting - 3-D Separation Control in a Linear Cascade with Diffusion

Kleven, Christopher, Corke, Thomas C., Frias, Dan, Hanson, David, Nolcheff, Nick

Language:

english

File:

PDF, 8.45 MB

english

21

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 6 October 2008)] Photomask Technology 2008 - Printability verification for double-patterning technology

Luk-Pat, Gerard, Kawahira, Hiroichi, Zurbrick, Larry S., Panaite, Petrisor, Lucas, Kevin, Cork, Christopher, Wiaux, Vincent, Verhaegen, Staf, Maenhoudt, Mireille

Year:

2008

Language:

english

File:

PDF, 1.27 MB

english, 2008

22

SPIE Proceedings [SPIE Photomask and NGL Mask Technology XV - Yokohama, Japan (Wednesday 16 April 2008)] Photomask and Next-Generation Lithography Mask Technology XV - Comparison of triple-patterning decomposition algorithms using aperiodic tiling patterns

Cork, Christopher, Madre, Jean-Christophe, Barnes, Levi, Horiuchi, Toshiyuki

Year:

2008

Language:

english

File:

PDF, 4.30 MB

english, 2008

23

Development of High Efficiency Virtual Impactors

Loo, Billy W., Cork, Christopher P.

Journal:

Aerosol Science & Technology

Year:

1988

Language:

english

File:

PDF, 508 KB

english, 1988

24

[ACM Press the fifth international conference - Nashville, Tennessee, USA (2006.04.19-2006.04.21)] Proceedings of the fifth international conference on Information processing in sensor networks - IPSN '06 - Wireless adhoc sensor and actuator networks on the farm

Sikka, Pavan, Corke, Peter, Valencia, Philip, Crossman, Christopher, Swain, Dave, Bishop-Hurley, Greg

Year:

2006

Language:

english

File:

PDF, 2.90 MB

english, 2006

25

Boys' Voices

Christopher Corke

Journal:

The Musical Times

Year:

1972

Language:

english

File:

PDF, 258 KB

english, 1972

26

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Design and Process Integration for Microelectronic Manufacturing III - Line end design intent estimation using curves

Hung, Chi-Yuan, Liebmann, Lars W., Gao, Gensheng, Zhang, Steven, Deng, Ze-Xi, Cork, Christopher, Melvin III, Lawrence S., Jiang, Yan

Year:

2005

Language:

english

File:

PDF, 326 KB

english, 2005

27

Recurrent Cardiogenic Shock Associated with Cannabis Use: Report of a Case and Review of the Literature

Grigoriadis, Christopher E., Cork, David P., Dembitsky, Walter, Jaski, Brian E.

Journal:

The Journal of Emergency Medicine

Year:

2019

Language:

english

File:

PDF, 260 KB

english, 2019

28

Failure to disrupt development of cholinergic fiber patches in the superior colliculus in nitric oxide synthase deficient mice

Christopher A Scheiner, R.John Cork, R.Ranney Mize

Journal:

Developmental Brain Research

Year:

1999

Language:

english

File:

PDF, 527 KB

english, 1999

29

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 22 February 2009)] Design for Manufacturability through Design-Process Integration III - Large-scale double-patterning compliant layouts for DP engine and design rule development

Cork, Christopher, Singh, Vivek K., Rieger, Michael L., Lucas, Kevin, Hapli, John, Raffard, Herve, Barnes, Levi

Year:

2009

Language:

english

File:

PDF, 3.31 MB

english, 2009

30

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 21 February 2010)] Optical Microlithography XXIII - Implementing and validating double patterning in 22-nm to 16-nm product design and patterning flows

Noh, Myung-Soo, Dusa, Mircea V., Conley, Will, Seo, Beom-Seok, Lee, Suk-Joo, Miloslavsky, Alex, Cork, Christopher, Barnes, Levi, Lucas, Kevin

Year:

2010

Language:

english

File:

PDF, 1.71 MB

english, 2010

31

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Optical Microlithography XIX - Calibrating OPC models using asymmetric structures

Depre, Laurent, Flagello, Donis G., Cork, Christopher, Yan, Qiliang

Year:

2006

Language:

english

File:

PDF, 327 KB

english, 2006

32

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 24 February 2013)] Optical Microlithography XXVI - An investigation into scalability and compliance for triple patterning with stitches for metal 1 at the 14nm node

Cork, Christopher, Conley, Will, Miloslavsky, Alexander, Friedberg, Paul, Luk-Pat, Gerry

Year:

2013

Language:

english

File:

PDF, 1.14 MB

english, 2013

33

An in vitro electrophysiological assessment of the direct cellular toxicity of carbon monoxide

Michael S. Raybourn, Christopher Cork, Walter Schimmerling, Cornelius A. Tobias

Journal:

Toxicology and Applied Pharmacology

Year:

1978

Language:

english

File:

PDF, 824 KB

english, 1978

34

Time and Beat

Christopher Corke, Richard Graves, Leon Forrester and Roger Wibberley

Journal:

The Musical Times

Year:

1969

Language:

english

File:

PDF, 419 KB

english, 1969

35

SPIE Proceedings [SPIE 26th Annual BACUS Symposium on Photomask Technology - Monterey, CA (Monday 18 September 2006)] Photomask Technology 2006 - Accounting for lens aberrations in OPC model calibration

Depre, Laurent, Martin, Patrick M., Naber, Robert J., Cork, Christopher, Drapeau, Martin

Year:

2006

Language:

english

File:

PDF, 334 KB

english, 2006

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